X-ray Microanalysis at High Count Rate with Latest Generation Silicon Drift Energy Dispersive Spectrometer
نویسندگان
چکیده
منابع مشابه
Silicon Drift Detectors for High Resolution, High Count Rate X-ray Spectroscopy at Room Temperature
Silicon Drift Detectors (SDDs) consist of a fully depleted volume in which an electric field drives signal charges to a small sized anode. Due to their topology SDDs combine a large sensitive area with a small output capacitance. In an advanced SDD version for X-ray spectroscopy designed and fabricated at the MPI semiconductor laboratory the input transistor of the amplifying electronics has be...
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Electron-excited X-ray mapping is a key operational mode of the scanning electron microscope (SEM) equipped with energy dispersive X-ray spectrometry (EDS). The popularity of X-ray mapping persists despite the significant time penalty due to the relatively low output count rates, typically less than 25 kHz, that can be processed with the conventional EDS. The silicon drift detector (SDD) uses t...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2018
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927618004117